The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Sep. 28, 2017
Applicant:

Jpmorgan Chase Bank, N.a., New York, NY (US);

Inventors:

Jagmohan Singh, Coppell, TX (US);

Priya Ranjan, Kendall Park, NJ (US);

Assignee:

JPMORGAN CHASE BANK, N.A., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3664 (2013.01); G06F 11/3688 (2013.01);
Abstract

The invention relates to implementing a test data tool that generates test data based on production data patterns. According to an embodiment of the present invention, the test data tool comprises: a processor configured to: receive, via the data input, production data from the one or more production environments, the production data comprises personally identifiable information; identify a plurality of attributes from the production data; for each attribute, identify one or more data patterns; generate one or more rules that define the one or more data patterns for each attribute; generate a configuration file based on the one or more rules; apply the configuration file to generate test data in a manner that obscures personally identifiable information existing in the production data; and transmit the test data to a UAT environment.


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