The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Sep. 23, 2016
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Keishi Ooshima, Tokyo, JP;
Yasunori Hashimoto, Tokyo, JP;
Ryota Mibe, Tokyo, JP;
Hirofumi Danno, Tokyo, JP;
Kiyoshi Yamaguchi, Tokyo, JP;
Assignee:
HITACHI, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 7/00 (2006.01); G06F 11/36 (2006.01); G06F 16/21 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 16/21 (2019.01);
Abstract
A test DB data generation method for generating a database for testing, which approximates an existing database, the test DB data generation apparatus comprising: extracting distribution information of values of each column of the existing database; extracting column dependency information of the existing database; and generating test DB data based on the distribution information and the column dependency information.