The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Mar. 16, 2015
Sandisk Technologies Llc, Plano, TX (US);
Jim Peterson, San Jose, CA (US);
Michael Callahan, Salt Lake City, UT (US);
SanDisk Technologies LLC, Addison, TX (US);
Abstract
Storage divisions are selected for garbage collection by use of a first selection criterion that is based on an amount of storage capacity freed by reclaiming the respective storage divisions. The first selection criterion may be overridden by a second, different selection criterion in response to determining that a wear variance of the storage divisions exceeds a threshold. The second selection criterion may select a storage division to reclaim based on a wear-level of the storage division. Overrides of the first selection criterion may be limited to a particular override frequency and/or period. The first selection criterion may comprise a logarithmic comparison of the amount of invalid data within the storage divisions. The amount of invalid data in a storage division may be calculated in terms of recovery blocks, having a size that exceeds the size of the physical storage locations within the storage divisions.