The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Dec. 04, 2014
Cgg Services SA, Massy, FR;
Thomas Bardainne, Massy, FR;
CGG SERVICES SAS, Massy, FR;
Abstract
The present disclosure includes a method including determining a spatial region for analysis and selecting a segment of time for analysis, analyzing and correcting a plurality of traces from a plurality of receivers using an iterative non-linear inversion algorithm, wherein each iteration of the non-linear algorithm corrects the plurality of traces using at least one set of parameters defining a microseismic event, determining whether a final stack value of the plurality of traces corrected based on the at least one set of parameters of a final iteration of the iterative non-linear inversion algorithm exceeds a predetermined threshold and upon a determination that the final stack value exceeds the predetermined threshold, detecting a microseismic event defined by the at least one set of parameters of final iteration. The present disclosure also includes associated systems and computer-readable media.