The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Oct. 12, 2015
Applicant:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Alan B. McMillan, Madison, WI (US);

Hyungseok Jang, Madison, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/24 (2006.01); G01R 33/565 (2006.01); G01R 33/385 (2006.01); G01R 33/389 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56572 (2013.01); G01R 33/243 (2013.01); G01R 33/4816 (2013.01); G01R 33/4824 (2013.01);
Abstract

A system and method for determining an actual gradient field generated by a magnetic resonance imaging (MRI) system when controlled to produce a prescribed gradient field is provided. The techniques include using the prescribed gradient field, controlling the MRI system to perform a phase encoding including a gradient that is scaled along each direction desired to be measured over a selected number of encoding times and acquiring one-dimensional (1D) data using a prescribed k-space trajectory during the phase encoding. The 1D data is used to determine scaling factors between encoding times that correlate to actual k-space trajectories achieved when controlling the gradient coils to perform the phase encoding based on the desired gradient field and a report is generated that provides a measure of the actual gradient field generated when controlling the MRI system to produce the prescribed gradient field.


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