The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Jun. 18, 2015
George S. Cembrowski, Edmonton, CA;
Mark A. Cervinski, Lebanon, NH (US);
George S. Cembrowski, Edmonton, CA;
Mark A. Cervinski, Lebanon, NH (US);
CCQCC CORP., Alberta, CA;
Abstract
Generally discussed herein are systems, apparatuses, and methods that relate to detecting an error in a laboratory analyzer. A device may include an average of deltas (AoD) module to receive pairs of consecutive measurement values of an analyte of one or more patients, each pair of consecutive measurement values including a first measurement of an analyte obtained from a patient of the one or more patient at a first time and a second measurement of an analyte obtained from the patient at a second time after the first time, determine a time delta between each pair of consecutive measurement values, determine whether the time delta is within a specified time window, determine a measurement value deltas between each pair of consecutive measurement values that includes a time delta with the specified time window, and determine an AoD using the determined measurement value deltas.