The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Aug. 15, 2017
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventor:

George Pieter Reitsma, Redwood City, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/483 (2006.01); A61B 5/053 (2006.01);
U.S. Cl.
CPC ...
G01N 33/483 (2013.01); A61B 5/053 (2013.01); A61B 5/0531 (2013.01);
Abstract

A multi-frequency inductive sensing system can be used for spectrographic material analysis of a conductive target material (such as tissue) based on electrical impedance spectroscopy. An inductive senor can be driven with an excitation current at multiple sensor excitation frequencies (ω) to project a time-varying magnetic field into a sensing area on the surface of the target material, inducing eddy currents within the target material. The inductive sensor can be characterized by a sensor impedance Z(ω) as a function of the sensor excitation frequency (ω), and the resulting induced eddy currents. Multiple sensor impedance Zs(ω) measurements, at the multiple sensor excitation frequencies (ω), can be determined, which represent electromagnetic properties of the target material (such as permittivity ε, permeability μ, and resistivity ρ), based on the induced eddy currents. The multiple sensor excitation frequencies (ω), and corresponding multiple sensor impedance Zs(ω) measurements, can be selected for particular target penetration depths.


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