The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Jan. 19, 2018
Applicants:
Ernest J. Feleppa, Rye, NY (US);
Jonathan Mamou, New York, NY (US);
Daniel Rohrbach, Brooklyn, NY (US);
Inventors:
Ernest J. Feleppa, Rye, NY (US);
Jonathan Mamou, New York, NY (US);
Daniel Rohrbach, Brooklyn, NY (US);
Assignee:
Riverside Research Institute, New York, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/032 (2006.01); G01N 29/44 (2006.01); G01N 29/46 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/032 (2013.01); G01N 29/449 (2013.01); G01N 29/4454 (2013.01); G01N 29/4472 (2013.01); G01N 29/46 (2013.01); G01N 2291/02466 (2013.01); G06F 17/18 (2013.01);
Abstract
An ultrasonic material-evaluation or classification method using spectral and envelope-statistics variables from backscattered ultrasound echo signals using an adaptive-bandwidth and combined with global variables. This classification method can be applied to any organ or tissue among biological materials and any non-biological material that produces backscattered signals as a result of microscopic internal in homogeneities such as a crystalline structure.