The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Apr. 11, 2016
Arkray, Inc., Kyoto, JP;
Shinya Nakajima, Kyoto, JP;
ARKRAY, Inc., Kyoto, JP;
Abstract
Provided is a measurement system for performing qualitative measurement and quantitative measurement of a measurement item of a biological sample, the measurement system including a quantitative sample adjustment criterion storage section that stores a quantitative sample adjustment criterion corresponding to a qualitative measurement result in the qualitative measurement, a determination section that determines a proper quantitative sample adjustment condition by referring to the quantitative sample adjustment criterion to determine necessity to change the quantitative sample adjustment condition based on the qualitative measurement result, and an adjustment section that adjusts the biological sample based on the quantitative sample adjustment condition determined by the determination section.