The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Mar. 23, 2016
Rodenstock Gmbh, München, DE;
RODENSTOCK GMBH, München, DE;
Abstract
A method and an apparatus for determining surface data and/or measurement data relating to a surface, for the quality control of an at least a partially transparent object, an ophthalmic lens, having an optically active first surface and an opposite optically active second surface. The method includes irradiating polarized light with an irradiation polarization from at least one illumination device onto an analysis area of the object to be examined, wherein, for the purpose of setting the irradiation polarization, the light is passed through a polarizer assigned to the illumination device or integrated in the latter, and receiving light which is reflected at the first and/or second surface and has an analysis polarization by use of at least one receiving device, wherein the light is passed through an analyzer assigned to the receiving device or integrated in the latter.