The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Dec. 11, 2015
Applicant:

University of Seoul Industry Cooperation Foundation, Seoul, KR;

Inventors:

Hyung Sup Jung, Seoul, KR;

Sung Hwan Park, Seoul, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01J 5/02 (2006.01); G01W 1/00 (2006.01);
U.S. Cl.
CPC ...
G01J 5/007 (2013.01); G01J 5/02 (2013.01); G01J 5/025 (2013.01); G01J 5/026 (2013.01); G01W 1/00 (2013.01); G01J 2005/0077 (2013.01);
Abstract

A method of estimating land surface temperature lapse rate using an infrared image is disclosed. In the method of estimating land surface temperature lapse rate using an infrared image, a target area for the estimation of land surface temperature lapse rate is selected. The atmospheric transmittance of the target area is calculated. Reference temperature is estimated at a reference location set in the target area as desired. A temperature difference is calculated from the atmospheric transmittance and the estimated reference temperature, and then a temperature difference image is generated. Land surface temperature lapse rate is estimated from the temperature difference image and a Digital Elevation Map (DEM) in an identical area using an elevation-based temperature difference distribution.


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