The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Mar. 02, 2017
CI Systems (Israel) Ltd., Migdal Ha'emek, IL;
Dario Cabib, Timrat, IL;
CI SYSTEMS (ISRAEL) LTD., Migdal Ha'emek, IL;
Abstract
An interference fringe pattern generator forms an interference fringe pattern from the light rays diffused from a region of an object positioned against a background. A planar array of detector pixels is arranged to capture an image of the interference fringe pattern. A storage medium records information indicative of intensity values of the image of the interference fringe pattern captured by a selected group of pixels of the planar array of detector pixels. The information is recorded as a function of the optical path difference values traversed by the diffused light rays through the interference fringe pattern generator for each of the pixels in the selected group of pixels. A processor determines the spectral characteristics of the object based on the information indicative of the intensity values recorded by the storage medium and the optical path difference values traversed by the diffused light rays.