The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Feb. 20, 2018
Baker Hughes, a GE Company, Llc, Houston, TX (US);
Thomas Kruspe, Wietzendorf, DE;
Sebastian Jung, Isernhagen, DE;
Baker Hughes, A GE Company, LLC, Houston, TX (US);
Abstract
An optical spectrometer with a tilted or brazed optical grating is useful to identify material composition, estimate physical characteristics, and measure physical conditions. Light from a sample or a space reflects to the grating; and stray light from the grating directed on an optical sensor (which can be a single sensor) and converted into an electrical signal, to obtain information about the sample or space. Examples of scanning include altering an angle the light strays from the optical grating by applying a strain to the optical grating, moving the optical sensor, and installing a mirror in the path of the stray light that reciprocatingly pivots over an angular range. In an example, the optical grating is formed on a light transmission medium that mounts to a piezoelectric element, that expands when energized to apply strain to the grating. In an example, the diffraction grating is a Fiber Bragg Grating.