The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

May. 26, 2015
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Prokop Jehlicka, Oberursel, DE;

Daniel Rolf, Berlin, DE;

Hilko Hofmann, Liederbach, DE;

Björn Karge, Singapore, SG;

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/20 (2006.01); G01C 21/32 (2006.01); G08G 1/01 (2006.01); G01C 21/16 (2006.01); G01C 21/26 (2006.01); G01C 21/14 (2006.01);
U.S. Cl.
CPC ...
G01C 21/20 (2013.01); G01C 21/16 (2013.01); G01C 21/26 (2013.01); G01C 21/32 (2013.01); G08G 1/0112 (2013.01); G01C 21/14 (2013.01);
Abstract

A method comprising: collecting a plurality of probe data from a plurality of probe points by a probing device, said probe data comprising at least positional information, a speed vector and a direction of travel of the probing device and a timestamp of recording the probe data at a probe point; and estimating a trajectory of the probing device between two consecutive probe points as a cubic Hermite spline having the positions of said two consecutive probe points as control points and the speed vectors of said two consecutive probe points as control vectors.


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