The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Dec. 31, 2014
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Feng Liang, Shanghai, CN;

Song Jun Lv, Shanghai, CN;

Shi Yun Tang, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F02C 9/00 (2006.01); G01M 15/14 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
F02C 9/00 (2013.01); G01M 15/14 (2013.01); G05B 23/0235 (2013.01); G05B 23/0254 (2013.01); G05B 23/0275 (2013.01); F05D 2220/32 (2013.01); F05D 2270/301 (2013.01); F05D 2270/303 (2013.01); F05D 2270/306 (2013.01); F05D 2270/3015 (2013.01);
Abstract

An analysis method is disclosed for detecting a measurement error of operating parameters of a gas turbine. An embodiment of the method includes: obtaining multiple measured values of the operating parameters, the operating parameters being at least part of the variables of multiple functions, each of the functions including analysis ranges; putting the measured values of the operating parameters into the functions whose variables include the operating parameters to calculate the results of the functions; comparing the calculated results of the functions with the analysis ranges of the corresponding functions; identifying one or more measured values of operating parameters who are at least part of the variables of the functions whose calculated results fail to fall within the analysis ranges of the corresponding functions; and determining a measured value of an operating parameter including the highest likelihood of a measurement error.


Find Patent Forward Citations

Loading…