The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Aug. 02, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Hiroaki Tokito, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/00 (2014.01); B23K 26/02 (2014.01); B23K 26/08 (2014.01); B23K 26/04 (2014.01); B23K 26/044 (2014.01);
U.S. Cl.
CPC ...
B23K 26/0892 (2013.01); B23K 26/043 (2013.01); B23K 26/044 (2015.10);
Abstract

A laser processing apparatus including a processing nozzle for irradiating a workpiece with laser beam, a driving mechanism for relatively moving the processing nozzle and the workpiece, and a gap sensor for detecting a gap between the processing nozzle and the workpiece. The apparatus includes a gap control section referring to a measured value detected by the gap sensor and calculating a manipulating variable used for controlling the driving mechanism so as to maintain the gap during execution of laser processing at a first dimension, a power monitoring section monitoring electric power from a power supply and sending an abnormality detection signal to the gap control section when a power abnormality occurs, and a control action switching section switching a control action of the gap control section so as to increase the gap from the first dimension when the abnormality detection signal is sent to the gap control section.


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