The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Mar. 06, 2015
Shimadzu Corporation, Kyoto, JP;
Satoshi Sano, Kyoto, JP;
Toshiyuki Sato, Kyoto, JP;
Koichi Tanabe, Kyoto, JP;
Shingo Furui, Kyoto, JP;
Toshinori Yoshimuta, Kyoto, JP;
Hiroyuki Kishihara, Kyoto, JP;
Takahiro Doki, Kyoto, JP;
Akira Horiba, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
Provided is a radiation phase difference imaging apparatus in which a separation distance between a phase grating and a radiation detector is optimized. The separation distance between the phase grating and a detection surface of an FPD is determined based on the magnitude of noise corruption in a self-image projected onto the detection surface. The magnitude of the effect of the noise is used as a basis for assessing the separation distance. It is determined whether a distance Zd is appropriate for imaging, based on the magnitude of noise corruption in the self-image in a self-image picture which is obtained when the distance Zd is the distance between the phase grating and the detection surface of the FPD. The separation distance can thus be optimized based on actual conditions of an actual X-ray source that emits a plurality of types of X-rays.