The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 02, 2019

Filed:

Mar. 14, 2013
Applicant:

Dexcom, Inc., San Diego, CA (US);

Inventors:

Stephen J. Vanslyke, Carlsbad, CA (US);

Naresh C. Bhavaraju, San Diego, CA (US);

Lucas Bohnett, San Diego, CA (US);

Arturo Garcia, Chula Vista, CA (US);

Apurv Ullas Kamath, San Diego, CA (US);

Jack Pryor, San Diego, CA (US);

Assignee:

DexCom, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1495 (2006.01); G16H 40/40 (2018.01);
U.S. Cl.
CPC ...
A61B 5/1495 (2013.01); G16H 40/40 (2018.01);
Abstract

Systems and methods for processing sensor data and calibration of the sensors are provided. In some embodiments, the method for calibrating at least one sensor data point from an analyte sensor comprises receiving a priori calibration distribution information; receiving one or more real-time inputs that may influence calibration of the analyte sensor; forming a posteriori calibration distribution information based on the one or more real-time inputs; and converting, in real-time, at least one sensor data point calibrated sensor data based on the a posteriori calibration distribution information.


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