The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Oct. 27, 2015
Boe Technology Group Co., Ltd., Beijing, CN;
Tieshi Wang, Beijing, CN;
Saihua Chen, Beijing, CN;
Xuefei Wang, Beijing, CN;
Wanpeng Teng, Beijing, CN;
Heliang Di, Beijing, CN;
Zhihong Du, Beijing, CN;
Shanshan Zhou, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
A testing method and a testing apparatus for splicing screens () are provided. The method includes: outputting an image signal to a display screen, wherein the display screen includes a plurality of splicing screens (), the image signal includes a plurality of testing sub pictures, the testing sub pictures are arranged correspondingly to the splicing screens () so as to enable the splicing screens () to display the corresponding testing sub pictures, and the testing sub pictures include testing contents (); and testing the splicing screens () through the testing contents (). Testing on the splicing screens () is achieved, and a testing result can be used for regulating the splicing screens (), so that defects generated in the displaying process of the splicing screens () are reduced.