The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Jul. 26, 2016
Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Kazushi Yoshioka, Minamikusatsu, JP;

Kengo Ichimura, Otsu, JP;

Hiroyuki Hazeyama, Kusatsu, JP;

Assignee:

OMRON Corporation, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G06T 7/75 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/30121 (2013.01); G06T 2207/30141 (2013.01);
Abstract

A positional calibration is enabled between an imaging device and a stage structure including X and Y stages that move independently of each other. An image processing apparatus performs the positional calibration of a camera coordinate system for an imaging device with a stage coordinate system using a reference position in a first image coordinate space indicating a position of a mark in an image captured when an X-stage is at a reference position, a displaced position in the first image coordinate space indicating a position of the mark in an image captured when the X-stage is at a first displaced position to which the X-stage moves in X-direction from the first reference position, and a virtual position in the first image coordinate space indicating a position of the mark in an image calculated using the characteristic value of a Y-stage.


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