The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

May. 11, 2016
Applicant:

Thomson Licensing, Issy les Moulineaux, FR;

Inventors:

Benoit Vandame, Betton, FR;

Mozhdeh Seifi, Thorigne-Fouillard, FR;

Valter Drazic, Betton, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/25 (2018.01); H04N 13/246 (2018.01); H04N 5/225 (2006.01); H04N 17/00 (2006.01); G02B 27/00 (2006.01); H04N 13/122 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/246 (2018.05); G02B 27/0075 (2013.01); H04N 5/2254 (2013.01); H04N 13/122 (2018.05); H04N 13/25 (2018.05); H04N 17/002 (2013.01); H04N 2013/0074 (2013.01);
Abstract

A method for obtaining a refocused image from a 4D raw light field data for a given focus (z) is described. The method is remarkable in that it comprises applying a shift correction parameter on shifted and summed images from said 4D raw light field data, the shifted and summed images being defined as a function of the given focus (z), and the shift correction parameter (Δ) including, for at least a part of pixels of at least two sub-aperture images derived from at least one 4D light field data of a test-chart image, determined shifts for pixels belonging to the part of pixels between the at least two sub-aperture images, the test-chart image comprising patterns adequate to compute disparities between the sub-apertures images.


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