The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Jun. 01, 2018
Qcify Inc., San Mateo, CA (US);
Raf Peeters, San Mateo, CA (US);
Bert Peelaers, Herentals, BE;
Qcify Inc., San Mateo, CA (US);
Abstract
An in-flight 3D inspector includes a sample input funnel, a sample chute, a trigger, a plurality of cameras, a light source and storage device. A sample is placed in the sample input funnel and is caused to travel down the sample chute. The trigger is located on the sample chute and detects when the sample passes the trigger. In response to detecting the passing of the sample, the trigger outputs a trigger signal that indicates when the sample will pass through a focal plane on which all the plurality of cameras are focused. In response to the trigger signal, the sample is illuminated by the light source and the plurality of cameras capture an image of the sample as the sample passes through the focal plane. The captured images are stored on the storage device and used to generate a 3D image of the sample.