The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Dec. 19, 2016
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Ren-Chin Shr, Hsinchu, TW;

Yean-San Long, Hsinchu, TW;

En-Yun Wang, New Taipei, TW;

Min-An Tsai, Yunlin County, TW;

Hung-Sen Wu, Taoyuan, TW;

Teng-Chun Wu, Kinmen County, TW;

Cho-Fan Hsieh, Yilan County, TW;

Chin Lien, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02S 50/10 (2014.01);
U.S. Cl.
CPC ...
H02S 50/10 (2014.12);
Abstract

A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.


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