The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
May. 05, 2017
Applicants:
Boe Technology Group Co., Ltd., Beijing, CN;
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, Anhui, CN;
Inventors:
Assignees:
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H01L 21/66 (2006.01); H01L 23/544 (2006.01); H01L 27/12 (2006.01);
U.S. Cl.
CPC ...
H01L 22/32 (2013.01); G01R 31/2886 (2013.01); H01L 22/14 (2013.01); H01L 23/544 (2013.01); H01L 27/12 (2013.01); H01L 27/124 (2013.01);
Abstract
A film test structure and an array substrate are provided. The film test structure includes a conductive film to be tested; a plurality of test leads arranged at a different layer from the conductive film to be tested and electrically connected with the conductive film to be tested respectively; and a plurality of test terminals electrically connected with the plurality of test leads respectively.