The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Jul. 05, 2017
Applicant:

Tsinghua University, Beijing, CN;

Inventors:

Dong Du, Beijing, CN;

Jinle Zeng, Beijing, CN;

Li Wang, Beijing, CN;

Baohua Chang, Beijing, CN;

Shuhe Chang, Beijing, CN;

Guodong Peng, Beijing, CN;

Wenzhu Wang, Beijing, CN;

Assignee:

TSINGHUA UNIVERSITY, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); H04N 7/18 (2006.01); G06T 7/70 (2017.01); G06T 7/00 (2017.01); H04N 5/225 (2006.01); B23K 9/028 (2006.01); B23K 9/095 (2006.01); H04N 13/00 (2018.01); B23K 101/06 (2006.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); B23K 9/0282 (2013.01); B23K 9/0956 (2013.01); G06T 7/0004 (2013.01); H04N 5/2256 (2013.01); B23K 2101/06 (2018.08); G06T 2207/10016 (2013.01); G06T 2207/30152 (2013.01); G06T 2207/30164 (2013.01); G06T 2207/30241 (2013.01);
Abstract

Apparatuses and methods for detecting multilayer multipass welding trajectory are disclosed. The apparatus includes an imaging component, a first and a second directional light source group, a structured light source and a control and processing component. The imaging component is disposed in front of a welding gun and above a weld pass. The first and the second directional light source group are disposed symmetrically above the weld pass and at two sides of the weld pass. The structured light source is disposed above the weld pass. The control and processing component is configured to control the imaging component to capture an image of the workpiece surface separately when the first directional light source group, the second directional light source group or the structured light source emits the light to the workpiece surface and to obtain a multilayer multipass welding trajectory according to the images.


Find Patent Forward Citations

Du, Dong. (2019). Apparatus and method for detecting multilayer multipass welding trajectory (U.S. Patent No. 10332271). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10332271

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