The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Dec. 29, 2016
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Timothy Wayne Deller, Elm Grove, WI (US);
Floribertus Heukensfeldt Jansen, Ballston Lake, NY (US);
Pal Csongor Sprencz, Budapest, HU;
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 7/00 (2017.01); G06T 11/00 (2006.01); G06T 5/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 11/008 (2013.01); G06T 2207/10104 (2013.01); G06T 2207/30004 (2013.01);
Abstract
Methods and systems are provided for interpolating acquired data of a tracer distribution. In one embodiment, a method comprises reconstructing the acquired data, and interpolating the reconstructed data with a surface, wherein a slope of the surface at a data point of the reconstructed data is limited by a value of the data point. In this way, interpolation artifacts around objects with high tracer density may be avoided.