The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Mar. 15, 2017
Applicant:

Wipro Limited, Bangalore, IN;

Inventors:

Sendil Kumar Jaya Kumar, Bangalore, IN;

Sujatha Jagannath, Bangalore, IN;

Assignee:

Wipro Limited, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06K 9/03 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6267 (2013.01); G06K 9/00684 (2013.01); G06K 9/036 (2013.01); G06K 9/4604 (2013.01); G06K 9/6227 (2013.01); G06K 9/4619 (2013.01);
Abstract

The present disclosure is related in general to image processing and a method and system for generating a multi-level classifier for image processing. An image processing system may analyze an input image of a predetermined image type to extract unique key feature descriptors associated with the input image. Further, the unique key feature descriptors are resized into a predefined standard template format which is utilized to develop an image type classifier. Furthermore, the unique key feature descriptors are resized into each of one or more template classifiers of the predetermined image type. Further, signal quality value of each of the template classifiers is determined by validating each of the unique key feature descriptors resized based on each of the template classifiers and an image prediction classifier is developed based on the signal quality value.


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