The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Nov. 25, 2017
Bertec Corporation, Columbus, OH (US);
Todd Christopher Wilson, Columbus, OH (US);
Necip Berme, Worthington, OH (US);
Bertec Corporation, Columbus, OH (US);
Abstract
A measurement and testing system is disclosed herein. The measurement and testing system includes a plurality of force measurement assemblies; an input device configured to output a signal comprising input data indicative of which of the plurality of force measurement assemblies are to be combined with one another; and a data processing device operatively coupled to the input device and each of the force transducers of each of the force measurement assemblies, the data processing device is configured to receive the signal outputted by the input device and to form a virtual force measurement assembly comprising a subset of the plurality of force measurement assemblies based upon the input data of the signal. In one or more embodiments, the data processing device further is configured to combine a plurality of measurement signals with varying sampling rates into a single time-synced synthetic channel.