The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Nov. 27, 2013
Applicant:
Astrium Gmbh, Taufkirchen, DE;
Inventors:
Peter Kern, Salem, DE;
Rainer Treichel, Uhldingen-Muehlhofen, DE;
Assignee:
AIRBUS DEFENCE AND SPACE GMBH, Taufkirchen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/16 (2006.01); G02B 21/24 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/36 (2013.01); G02B 21/16 (2013.01); G02B 21/24 (2013.01); G02B 21/26 (2013.01); G02B 21/362 (2013.01);
Abstract
A device for microscopic examination includes an image output unit, at least two image input units, which are arranged in a spatially distributed manner and which have different sample receiving regions, at least one object carrier unit which supports at least one sample, in particular at least one biological sample, and includes a coupling unit, which couples the image output unit and one of the at least two image input units optically to form a microscope unit.