The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Oct. 20, 2016
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Cameron Musgrove, Albuquerque, NM (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
Various technologies for mitigating interference in stretch-processed SAR imagery are described herein. Stretch-processed SAR data is received at a computing device. The stretch-processed (or deramped) SAR data is then reramped, thereby removing frequency-variant components of narrowband interference signals in the deramped data. A frequency-domain transform is executed over the reramped data to generate a spectral characteristic of the reramped data. A spectral notch filter is applied to frequency bands corresponding to the peaks of the spectral characteristic in order to filter out the narrowband interference signals. An inverse frequency-domain transform can then be executed over the filtered spectral characteristic to return to a phase-history representation of the SAR data. The phase history resulting from the inverse frequency-domain transform is a ramped phase history, which can then be deramped prior to use in connection with generating images of the scanned scene.