The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Feb. 15, 2016
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Assignee:
HITACHI, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/36 (2006.01); A61B 5/055 (2006.01); G01R 33/28 (2006.01); G01R 33/565 (2006.01); G01R 33/24 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3607 (2013.01); A61B 5/055 (2013.01); G01R 33/288 (2013.01); G01R 33/5659 (2013.01); G01R 33/246 (2013.01);
Abstract
In order to improve B1 non-homogeneity while reducing a local SAR in an object, particularly, in a human tissue during MR imaging, the present invention is characterized in that each of a plurality of irradiation channels is controlled on the basis of RF shimming parameters corresponding to the plurality of irradiation channels, and, in a case of performing imaging sequence of irradiating an object with an RF magnetic field, there is the use of the RF shimming parameters obtained by imposing a constraint condition on at least one of a plurality of principal components obtained through principal component analysis on the RF shimming parameters.