The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Jul. 17, 2015
Applicant:
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Inventors:
Mrinal Bose, Austin, TX (US);
James Longino, Austin, TX (US);
Laxmi Narayana Yakkala, Austin, TX (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G01R 31/3183 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3172 (2013.01); G01R 31/3177 (2013.01); G01R 31/318335 (2013.01); G01R 31/318371 (2013.01); G06F 17/50 (2013.01);
Abstract
A method for minimizing a test set for optimal coverage is disclosed. The method includes generating a first test set which is both an empty and minimal test set. Then, generating a second test set with a predetermined number of tests. Further, partitioning the second test set into a control test set and an experiment test set. Subsequently, providing a list of tests for coverage by merging the control test set with the first test set to form a merged list of sets.