The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Dec. 11, 2016
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

Edward Brorein, Cedar Knolls, NJ (US);

Marko Vulovic, Columbia, NJ (US);

Bryan Boswell, Loveland, CO (US);

Robert Zollo, North Haledon, NJ (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/36 (2019.01); G01R 31/367 (2019.01); G01R 31/396 (2019.01); G01R 31/385 (2019.01); G01R 31/374 (2019.01);
U.S. Cl.
CPC ...
G01R 31/025 (2013.01); G01R 31/367 (2019.01); G01R 31/3865 (2019.01); G01R 31/396 (2019.01); G01R 31/374 (2019.01);
Abstract

In accordance with one illustrative embodiment, a system for determining a self-discharge current characteristic of a storage cell (or a bank of storage cells) includes a voltage source, first and second voltage measurement circuits, a current measurement circuit, and a processor. The voltage source provides a potentiostat voltage to the storage cell coupled to the system. The first voltage measurement circuit provides a first voltage resolution for measuring an open circuit voltage across a pair of terminals of the storage cell. The second voltage measurement circuit provides a second voltage resolution that is significantly higher than the first voltage resolution for measuring a terminal voltage at one of the pair of terminals of the storage cell. The processor executes a test procedure by using the voltage source, the first and second voltage measurement circuits, and the current measurement circuit, to determine the self-discharge leakage current characteristic of the storage cell.


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