The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Jun. 04, 2014
Applicant:

Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;

Inventors:

Sverker Sander, Billdal, SE;

Björn Olsson, Göteborg, SE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 13/04 (2006.01); G08C 19/36 (2006.01); G08C 23/04 (2006.01); H04Q 9/00 (2006.01); G01R 31/28 (2006.01); G01R 31/302 (2006.01); G01R 31/309 (2006.01);
U.S. Cl.
CPC ...
G01R 13/04 (2013.01); G01R 31/2818 (2013.01); G01R 31/3025 (2013.01); G08C 19/36 (2013.01); G08C 23/04 (2013.01); H04Q 9/00 (2013.01); G01R 31/309 (2013.01);
Abstract

The present invention relates to a system, a measurement probe and a method for measuring an electrical property of an electrical circuit, comprising measuring the electrical property by means of a measurement probe connected to the electrical circuit, converting the measured electrical property of the electrical circuit to an optical signal. The method further comprises sending the optical signal, and receiving the optical signal by means of an image sensor configured to record images comprising the measurement probe that transmits the optical signal. The method further comprises processing the recorded images in order to decode the measurement data from the received optical signal.


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