The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Sep. 18, 2018
Applicant:

Johnstech International Corporation, Minneapolis, MN (US);

Inventors:

Jathan Edwards, Afton, MN (US);

Charles Marks, Minneapolis, MN (US);

Brian Halvorson, St. Paul, MN (US);

Assignee:

Johnstech International Corporation, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07314 (2013.01); G01R 1/0466 (2013.01); G01R 1/06738 (2013.01); G01R 3/00 (2013.01); G01R 1/06733 (2013.01); G01R 1/06772 (2013.01); G01R 1/07371 (2013.01);
Abstract

A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin () are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (). To prevent rotation of the pins in the pin guide, a walled recess in the bottom of the pin guide engages flanges on the pins. In another embodiment, the pin guide maintains rotational alignment by being fitted around the pin profile or having projections abutting the pin. The pin guide () is maintained in alignment with the retainerby establishing a registration corner () and driving the guide into the corner by elastomers in at least one diagonally opposite corner.


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