The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Mar. 13, 2016
Dsit Solutions Ltd., Givat Shmuel, IL;
Ramot AT Tel-aviv University Ltd., Tel Aviv, IL;
Avishay Eyal, Givat Shmuel, IL;
Eyal Leviatan, Tel Aviv, IL;
Meir Hahami, Petach Tikva, IL;
Yakov Botsev, Rishon Lezion, IL;
DSIT SOLUTIONS LTD., Givat Shmuel, IL;
RAMOT AT TEL-AVIV UNIVERSITY, Tel Aviv, IL;
Abstract
A system () for fiber-optic reflectometry includes an optical source (), a beat detection module (A,B) and a processor (). The optical source is configured to generate a non-linearly-scanning optical interrogation signal having an instantaneous optical frequency that is a non-linear function of time. The beat detection module is configured to transmit the optical interrogation signal into an optical fiber (), to receive from the optical fiber an optical backscattering signal in response to the optical interrogation signal, and to mix the optical backscattering signal with a reference replica of the optical interrogation signal, so as to produce a beat signal. The processor is configured (i) to hold a predefined function that is indicative of an expected phase of the beat signal resulting from the non-linearly-scanning optical interrogation signal as a function of position along the optical fiber and time, (ii) to estimate a backscattering profile of the optical fiber by applying the predefined function to the beat signal, and (iii) to sense one or more events affecting the optical fiber by analyzing the backscattering profile.