The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

May. 18, 2015
Applicant:

Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;

Inventor:

Hiroshi Satozono, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/04 (2006.01); G01N 21/19 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01N 21/19 (2013.01); G01J 4/04 (2013.01); G01N 2021/216 (2013.01);
Abstract

Circular dichroism can be accurately measured even when a phase modulation element with a distortion component is used. A circular dichroism measuring method using a circular dichroism measuring deviceincludes a step of measuring Ip(t) (S: phase amount change acquisition step), a step of measuring Is(t) (S: sample data acquisition step), a step of converting Ip(t) to δ(t) (S: phase amount change acquisition step), a step of converting Is(t) to Is(δ) (S: analysis step/Is(δ) calculation step), and a step of performing curve fitting to calculate matrix elements S00, S02, and S03 (S: analysis step/matrix element calculation step).


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