The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Mar. 26, 2014
Sikorsky Aircraft Corporation, Stratford, CT (US);
Yih-Farn Chen, Shelton, CT (US);
Leon M. Meyer, Harwinton, CT (US);
Fran Byrnes, White Plains, NY (US);
SIKORSKY AIRCRAFT CORPORATION, Stratford, CT (US);
Abstract
A system and method to substantiate safe-life criteria of a structure with an anomaly includes a flaw in a critical loaded region of a test structure; a processor; and memory having instructions stored thereon that, when executed by the processor, cause the system to receive first signals indicative of strain energy release rates (SERR) for the flaw at the critical loaded region of a test structure; fit the first signals for the flaw SERR to a Benzeggah-Kenane (B-K) mixed mode curve shape; determine values indicative of B-K criteria of the test structure in response to the fitting of the first signals; receive second signals indicative of SERR for the production structure; and compare the second signals with the B-K criteria of the test structure to substantiate the safe-life criteria.