The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Mar. 20, 2015
Applicant:

Pratt & Whitney Canada Corp., Longueuil, CA;

Inventors:

Mario Blais, Varennes, CA;

Martin Blanchet, Beloeil, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 5/00 (2006.01); B24C 1/10 (2006.01);
U.S. Cl.
CPC ...
G01L 5/0052 (2013.01); B24C 1/10 (2013.01);
Abstract

A system for assessing a calibration of a shot-peening apparatus using a part in a shot-peening session, comprising an intensity calculator for receiving real-time pressure data from at least one sensor positioned adjacent the part in the shot-peening session, and for calculating the intensity from the pressure data. A shot-peening parameter comparator compares the calculated intensity with a shot-peening intensity threshold range for the at least one sensor. A calibration assessor confirms a calibration of the shot-peening apparatus when the calculated intensity is within the shot-peening intensity threshold range for the at least one sensor. A method for assessing a calibration of a shot-peening apparatus is also provided.


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