The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Dec. 09, 2015
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Amardeep Sathyanarayana, Austin, TX (US);

Anand Dabak, Plano, TX (US);

David Patrick Magee, Allen, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/66 (2006.01);
U.S. Cl.
CPC ...
G01F 1/66 (2013.01); G01F 1/662 (2013.01); G01F 1/667 (2013.01);
Abstract

A method of ultrasound flow metering includes applying a first and second pulse train to an ultrasound transducer pair (T, T) positioned for coupling ultrasonic waves therebetween. Responsive to the first pulse train applied to T, Ttransmits an ultrasonic wave received as received ultrasonic wave (R) by Tafter propagating through fluid in a pipe. Responsive to the second pulse train applied to T, Ttransmits an ultrasonic wave received as received ultrasonic wave by (R) Tafter propagating through the fluid. During the pulse trains, Rand Rbuild up in amplitude to provide excitation portions. The pulse trains are terminated, so that Rand Rdecay as a damped free oscillation. Windowing is applied to Rand Rto generate windowed portions. A signal delay between tand t(ΔTOF) is calculated using only windowed portions, and a fluid flow is calculated from the ΔTOF.


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