The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 25, 2019
Filed:
Oct. 28, 2014
Applicant:
Oakland University, Rochester, MI (US);
Inventors:
Lianxiang Yang, Rochester Hills, MI (US);
Xin Xie, Auburn Hills, MI (US);
Nan Xu, Auburn Hills, MI (US);
Xu Chen, Auburn Hills, MI (US);
Assignee:
Oakland University, Rochester, MI (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01L 1/24 (2006.01); G01B 11/16 (2006.01); G01N 21/45 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02098 (2013.01); G01B 11/162 (2013.01); G01L 1/24 (2013.01); G01N 21/45 (2013.01); G01N 21/8806 (2013.01);
Abstract
Embodiments of a shearography system may include light sources configured to produce beams of light to illuminate a test area. Each of the beams of light may include a different wavelength. A camera may be configured to obtain intensity information corresponding to reflections of the lights off of the test area. An optical shearing device may be disposed in an optical path between the light sources and the camera and the optical shearing device may be configured to provide a shearing angle.