The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Jun. 20, 2018
Applicant:

Adom, Advanced Optical Technologies Ltd., Lod, IL;

Inventors:

Yoel Arieli, Jerusalem, IL;

Yoel Cohen, Nes Ziona, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01B 9/02 (2006.01); G01J 3/447 (2006.01); G01J 3/453 (2006.01); G01N 21/31 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); G01B 9/02019 (2013.01); G01J 3/0208 (2013.01); G01J 3/0224 (2013.01); G01J 3/447 (2013.01); G01J 3/453 (2013.01); G01N 21/31 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/0683 (2013.01);
Abstract

Apparatus and methods are described including a line spectrometer that receives a point of light. The line spectrometer includes a first optical element, and a second optical element configured to convert the point of light to a line of light and to direct the line of light toward the first optical element. The first optical element defines first and second surfaces, a distance between the first and second surface varying as a function of distance along the first optical element, the first optical element thereby being configured to generate first and second reflected lines of light that reflect respectively from the first and second surfaces. A detector array receives the first and second lines of light, and generates an interferogram in response thereto. A computer processor determines a spectrum of the point of light, by analyzing the interferogram. Other applications are also described.


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