The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Aug. 21, 2015
Applicant:

National Institute of Advanced Industrial Science and Technology, Tokyo, JP;

Inventors:

Tetsuhiko Miyadera, Tsukuba, JP;

Takeshi Sugita, Tsukuba, JP;

Takurou Murakami, Tsukuba, JP;

Masayuki Chikamatsu, Tsukuba, JP;

Koji Matsubara, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/12 (2006.01); C23C 14/28 (2006.01); H01G 9/20 (2006.01); H01L 51/00 (2006.01); H01L 51/42 (2006.01);
U.S. Cl.
CPC ...
C23C 14/12 (2013.01); C23C 14/28 (2013.01); H01G 9/2009 (2013.01); H01L 51/001 (2013.01); H01L 51/0009 (2013.01); H01L 51/422 (2013.01);
Abstract

A method of laser-depositing at least one type of organic material, characterized in that a duty ratio of a laser that evaporates the organic material is adjusted, which addresses the problem of providing an organic material deposition method and deposition apparatus that solve the issues in the conventional art, such as the organic material vaporizing and contaminating the other raw materials to be deposited, and the film formation rate running out of control, and whereby the film formation rate and the evaporation rate can be stably adjusted and controlled. Additionally, the invention is characterized in that the duty ratio is adjusted based on the evaporation rate of the organic substance or the vapor pressure inside the vacuum chamber used for deposition.


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