The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

Mar. 14, 2014
Applicant:

Carnegie Mellon University, Pittsburgh, PA (US);

Inventor:

Jack Lee Beuth, Jr., Pittsburgh, PA (US);

Assignee:

Carnegie Mellon University, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 40/00 (2015.01); B23K 31/12 (2006.01); B23K 31/02 (2006.01); B29C 64/153 (2017.01); B23K 103/14 (2006.01);
U.S. Cl.
CPC ...
B23K 31/12 (2013.01); B23K 31/02 (2013.01); B29C 64/153 (2017.08); B33Y 40/00 (2014.12); B23K 2103/14 (2018.08);
Abstract

In one aspect, a method includes conducting a plurality of tests on process variables of a thermal process, with a test of the plurality of tests being conducted on two or more process variables, the test comprising: locally heating a region of a structure, wherein the local heating results in formation of a thermal field in the structure; assessing one or more temperature integrals of the thermal field; and based on results of the plurality of tests, generating a process map of the one or more temperature integrals of the thermal field, with the one or more temperature integrals based on a function of the two or more process variables.


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Beuth, Jr., Jack. (2019). Process mapping of average temperatures and process sensitivity (U.S. Patent No. 10328532). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10328532

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