The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2019

Filed:

May. 12, 2017
Applicant:

Varian Medical Systems, Inc., Palo Alto, CA (US);

Inventors:

Alexander E. Maslowski, Lexington, KY (US);

Adam Wang, Menlo Park, CA (US);

Josh Star-Lack, Palo Alto, CA (US);

Mingshan Sun, Menlo Park, CA (US);

Todd Wareing, Gig Harbor, WA (US);

Assignee:

VARIAN MEDICAL SYSTEMS, INC., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); G01N 23/046 (2018.01); G06T 5/00 (2006.01); G06T 11/00 (2006.01); G09B 23/28 (2006.01); G06T 7/00 (2017.01); G06T 11/20 (2006.01); G21K 1/10 (2006.01); G21K 5/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5282 (2013.01); A61B 6/032 (2013.01); A61B 6/4035 (2013.01); A61B 6/4085 (2013.01); A61B 6/483 (2013.01); G01N 23/046 (2013.01); G06T 5/00 (2013.01); G06T 5/002 (2013.01); G06T 7/0012 (2013.01); G06T 11/005 (2013.01); G06T 11/20 (2013.01); G09B 23/286 (2013.01); G06T 2207/10081 (2013.01); G21K 1/10 (2013.01); G21K 5/04 (2013.01);
Abstract

In accordance with at least some embodiments of the present disclosure, a process to estimate scattered radiation contained in x-ray projections for computed tomography (CT) reconstruction is provided. The process may construct an object model based on a plurality of projection images generated by CT scanning of an object using an x-ray radiation source and a detector panel. The process may construct a virtual radiation source based on the x-ray radiation source, and a virtual detector panel based on the detector panel. The process may perform a simulated CT scanning of the object model by simulating macroscopic behavior of particles being emitted from the virtual radiation source, passing through the object model, and being detected by the virtual detector panel. And the process may generate a simulated scatter image based on a first subset of particles scattered during the simulated CT scanning of the object model.


Find Patent Forward Citations

Loading…