The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2019

Filed:

Mar. 16, 2017
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Sai Pradeep Venkatraman, Santa Clara, CA (US);

Ju-Yong Do, Cupertino, CA (US);

Gengsheng Zhang, Cupertino, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 5/02 (2010.01); G01S 5/10 (2006.01); G01S 5/12 (2006.01); G01S 5/14 (2006.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
H04W 64/003 (2013.01); G01S 5/0247 (2013.01); G01S 5/0263 (2013.01); G01S 5/10 (2013.01); G01S 5/12 (2013.01); G01S 5/14 (2013.01); G01S 5/0236 (2013.01); G01S 5/0252 (2013.01); G01S 5/0284 (2013.01);
Abstract

Disclosed embodiments facilitate combining a plurality of wireless signal measurement sets with displacement measurements within some time interval of a position request to determine a User Equipment (UE) position. A first set of wireless signal measurements may be obtained from a first set of base stations at a first time at a first location. Subsequently, a second set of wireless signal measurements from a second set of base stations may be obtained at a second time at a second location distinct from the first location. A displacement measurement (e.g. a displacement vector) between the first location and the second location may be obtained. The position of the UE at the second location may then be determined based on the first and second sets of wireless signal measurements and the displacement measurement. In some embodiments, the first and second sets of wireless signal measurements may each be deficient measurement sets.


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