The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2019

Filed:

Aug. 29, 2018
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Ankit Maheshwari, Hyderabad, IN;

Stephen William Edge, Escondido, CA (US);

Shruti Agrawal, Hyderabad, IN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/029 (2018.01); H04L 5/00 (2006.01); H04W 64/00 (2009.01); H04W 4/20 (2018.01);
U.S. Cl.
CPC ...
H04W 4/029 (2018.02); H04L 5/0048 (2013.01); H04W 4/20 (2013.01); H04W 64/003 (2013.01);
Abstract

Disclosed is a method and apparatus for location determination at a mobile device comprising sending positioning capabilities of the mobile device to a location server, where the positioning capabilities comprise an identification of a partial Radio Frequency (RF) band that is contained within a complete RF band. The positioning capabilities indicate that the mobile device can measure the partial RF band but cannot measure the complete RF band. The mobile device may subsequently receive location assistance data from the location server, where the location assistance data comprises configuration information for at least one reference signal (RS) in the partial RF band. The mobile device may then obtain at least one location measurement from the at least one RS based on the configuration information, and sends location information to the location server, where the location information is based on the at least one location measurement.


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