The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Feb. 06, 2018
Takahiro Fukase, Kanagawa, JP;
Takahiro Fukase, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An inspection apparatus includes circuitry to acquire a first scanned image by scanning each recording media printed with a target image, acquire a second scanned image by scanning one recording medium printed with a color chart including a plurality of color patches, generate index color information including information of index colors having higher frequency of occurrence on the one recording medium for each of the color patches, generate color conversion information by associating each of the color patches and each of the index colors, generate a reference image for each of the index colors by performing a color conversion of the target image by applying the color conversion information, calculate a difference of a color value of each pixel configuring the first scanned image and a color value of each pixel of each of reference images, and inspect the printed matter based on a plurality of color difference values.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile