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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10326268 B1

PDFFull Text
Date of Patent:
Jun. 18, 2019

Filed:

Aug. 01, 2016

Circuit reliability improvement by detecting and mitigating high voltage transient event at supply

Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Eung J. Kim, Allen, TX (US);

Md. Abidur Rahman, Richardson, TX (US);

Sualp Aras, Dallas, TX (US);

Assignee:

Texas Instruments Incorporated, Dallas, TX (US);

Attorneys:

Lawrence J. Bassuk

Charles A. Brill

Frank D. Cimino

Primary Examiner:

Stephen W Jackson

Int. Cl.
CPC ...
H02H 3/00 (2006.01); H02H 3/20 (2006.01); H02H 3/02 (2006.01);
U.S. Cl.
CPC ...
H02H 3/20 (2013.01); H02H 3/021 (2013.01);
Abstract

A circuit reliability system with a first voltage supply for outputting a first voltage and a second voltage supply for outputting a second voltage. The system also includes: (i) at least one node for providing a potential in response to the first voltage and the second voltage; (ii) monitoring circuitry for detecting the first voltage exceeding a threshold; and (iii) disabling circuitry, for disabling the second voltage supply in response to the monitoring circuitry detecting the first voltage exceeding a threshold.

Find Patent Forward Citations

Kim, Eung. (2019). Circuit reliability improvement by detecting and mitigating high voltage transient event at supply (U.S. Patent No. 10326268). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10326268

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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