The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Apr. 27, 2017
Crystalvue Medical Corporation, Toayuan, TW;
Long Hsu, Hsinchu, TW;
William Wang, Taoyuan, TW;
Cheng-Hsien Liu, Hsinchu, TW;
Po-Chen Shih, Kaohsiung, TW;
Ting-Sheng Shih, Taichung, TW;
Cheng-En Liu, Taipei, TW;
Chung-Yu Chou, Taichung, TW;
Chung-Cheng Chou, Luzhu Township, TW;
Crystalvue Medical Corporation, Taoyuan, TW;
Abstract
An optical measuring apparatus and an operating method thereof are disclosed. The optical measuring apparatus includes a light source, a carrier chip, a light sensor, an analyzing chip and a display. Samples are uniformly distributed on the carrier chip. The light source emits sensing lights toward the carrier chip. The light sensor receives the sensing lights passing through the carrier chip at a plurality of times to obtain a plurality of images corresponding to the plurality of times respectively. The analyzing chip is coupled to the light sensor. The analyzing chip analyzes the object number and distribution variation with time in the sample according to the plurality of images corresponding to the plurality of times and estimates intrinsic characteristics of the object in the sample accordingly. The display is coupled to the analyzing chip. The display displays the intrinsic characteristics of the object in the sample.